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3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Optional power supply available for

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Optional power supply available forC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

SKU: 54874758600 · From crisbcreativa.com

4.0
USD10375.00 USD10402.00

Pay in 4 interest-free payments of $2593.75 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 9 - Aug 14

Description

Optional power supply available for use with oscilloscopes that do not provide probe power

Simultaneous measurement of internal resistance and open circuit voltage

excellent noise resistance

Dedicated power supply for the CLAMP ON PROBE 3273-50/3274/3275/3276

Temperature / Voltage Unit for MR8847

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Optional power supply available forC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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